MICRON

美光是一个跨学科的论坛，为所有涉及显微镜新应用的工作，或在先进显微镜发挥核心作用。该杂志将出版有关显微镜和微观分析的设计、方法、应用、实践或理论，包括有关光学、电子束、X射线显微层析成像和扫描探针系统的报告。它还致力于定期发表评论论文、简短的交流以及关于显微镜和微量分析当代发展的专题问题。该杂志包含了原始的研究，其中显微镜在生物学、生命科学、纳米科学和纳米技术、材料科学和工程方面的知识做出了重大贡献。

Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.